Tektronix 2510-AT Source Measurement Unit

Tektronix 2510-AT Source Measurement Unit

The Models 2510 and 2510-AT TEC SourceMeter SMU instruments enhance Keithley’s CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules. These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecommunications networks. Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialised instruments created for telecommunications laser diode testing.

It brings together Keithley’s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module’s Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately.

Applications

  • Laser diode modules
  • IR charge-coupled device (CCD) arrays and charge-injection devices (CID)
  • Cooled photodetectors
  • Thermal-optic switches
  • Temperature controlled fixtures

SKU: 2510-AT Category:

Key Features

  • 50W TEC Controller combined with DC measurement functions
  • Fully digital P-I-D control
  • Autotuning capability for the thermal control loop (2510-AT)
  • Designed to control temperature during laser diode module testing
  • Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C)
  • Compatible with a variety of temperature sensor inputs—thermistors, RTDs, and IC sensors
  • Maintains constant temperature, current, voltage, and sensor resistance
  • AC Ohms measurement function verifies integrity of TEC
  • Measures and displays TEC parameters during the control cycle
  • 4-wire open/short lead detection for thermal feedback element
  • IEEE-488 and RS-232 interfaces
  • Compact, half-rack design

Application Notes