BT3562A BATTERY HiTESTER
Measuring battery performance and safety using internal resistance (AC-IR) and open-circuit voltage (OCV)
Hioki BT3562A Battery HiTester – Fully Automated Production Line Testing of Large Cells for xEVs or Mid-sized Packs of up to 100 V.
Inspect the quality of completed cells, modules, and packs on production lines with the Hioki BT3562A Battery HiTester. Measure internal resistance (AC-IR) and open-circuit voltage (OCV) to check battery quality. Cells produced at the cell production factory are shipped to the module production factory after undergoing a shipping inspection. Since factors such as vibrations during shipment and even the passage of time can cause defects, batteries undergo an acceptance inspection before being assembled into modules and packs.
The BT3562A reduces test system development cost and management man-hours
The new Hioki BT3562A Battery HiTester has dramatically improved tolerances for line resistance compared to previous models. This improvement makes it easy to build test systems with large numbers of channels using relays. Additionally, a longer maintenance cycle for systems in use means fewer maintenance man-hours. Finally, its capability to handle thinner cables than with previous models* makes it easier to route cables.
Hioki’s BT3562A Improves Productivity by Increasing the Number of Inspection Channels
You can use the Switch Mainframe Hioki SW1001/SW1002 to increase the number of measurement channels. Additionally, you can perform scan measurement by controlling two instruments at once, for example a BT356xA series instrument and a Hioki DM7276, or a BT4560 and a DM7276.
Large cells for xEVs, Mid-sized packs of up to 100 V
Voltage measurement ranges: 6 V/60 V/100 V
Resistance measurement ranges: 3 mΩ/30 mΩ/300 mΩ/3 Ω/30 Ω/300 Ω/3 kΩ
Basic specifications (Accuracy guaranteed for 1 year, Accuracy guarantee period after adjustment made by Hioki: 1 year)
| Resistance measurement ranges | 3 mΩ（Max. display: 3.1000 mΩ, resolution: 0.1 μΩ, measurement current: 100 mA） 30 mΩ（Max. display: 31.000 mΩ, resolution: 1 μΩ, measurement current: 100 mA） 300 mΩ（Max. display: 310.00 mΩ, resolution: 10 μΩ, measurement current: 10 mA） 3 Ω（Max. display: 3.1000 Ω, resolution: 100 μΩ, measurement current: 1 mA） 30 Ω（Max. display: 31.000 Ω, resolution: 1 mΩ, measurement current: 100 μA） 300 Ω（Max. display: 310.00 Ω, resolution: 10 mΩ, measurement current: 10 μA） 3 kΩ（Max. display: 3.1000 kΩ, resolution: 100 mΩ, measurement current: 10 μA）Basic accuracy: ±0.5% rdg ±10 dgt（3 mΩ range）, ±0.5% rdg ±5 dgt（30 mΩ range or more） Measurement frequency: 1 kHz ±0.2 Hz Measurement method: AC four-terminal method |
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| Voltage measurement ranges | 6 V（Max. display: 6.00000 V, resolution: 10 μV） 60 V（Max. display: 60.0000 V, resolution: 100 μV） 100 V（Max. display: 100.000 V, resolution: 1 mV）Basic accuracy: ±0.01% rdg. ±3 dgt. |
| Response time | 10 ms |
| Sampling period | Ω or V (60 Hz): 4 ms (EX.FAST), 12 ms (FAST), 35 ms (MEDIUM), 150 ms (SLOW) ΩV (60 Hz): 8 ms (EX.FAST), 24 ms (FAST), 70 ms (MEDIUM), 253 ms (SLOW)Ω or V (50 Hz): 4 ms (EX.FAST), 12 ms (FAST), 42 ms (MEDIUM), 157 ms (SLOW) ΩV (50 Hz): 8 ms (EX.FAST), 24 ms (FAST), 84 ms (MEDIUM), 259 ms (SLOW) |
| Functions | Contact check, Zero adjustment (±1000 counts), Pulse measurement, Comparator (Hi/ IN/ Lo), Statistical calculations (Max. 30,000), Delay, Average, Panel saving/loading, Memory storage, LabVIEW® driver |
| Interfaces | LAN (TCP/IP, 10BASE-T/100BASE-TX) RS-232C (Max. 38.4 kbps, Available as printer I/F) EXT I/O (37-pin Handler interface) Analog output (DC 0 V to 3.1 V) |
| Power supply | 100 to 240 V AC, 50 Hz/60 Hz, 35 VA max. |
| Dimensions and mass | 215 mm (8.46 in) W × 80 mm (3.15 in) H × 295 mm (11.61 in) D, 2.4 kg (84.7 oz) |
