Hioki FA1816 Flying Probe Tester

Hioki FA1816 Flying Probe Tester

Introducing the HIOKI FA1816 Flying Probe Tester – the ultimate solution for accurate and efficient PCB and substrate inspection. Our equipment utilizes our expertise in high-precision component testing to deliver unparalleled results. The FA1816 boasts a rapid 100 times/second test speed and can detect latent defects on HDI and substrate, ensuring that each FAIL is identified with utmost precision.

With its capacitive measurement method, the FA1816 offers high-speed pattern testing of up to 100 points/second, resulting in much fewer steps than traditional resistance testing. This method also minimizes probe marks, making it ideal for delicate components and substrates.

The FA1816 is designed with ease of use in mind, featuring a streamlined workflow menu that simplifies the test data creation process. Operators can create master data with just a single click, eliminating the need for time-consuming and labor-intensive steps. The graphical interface allows for intuitive operation, while all essential information is consolidated onto a single screen, ensuring that users have quick access to critical data.

In addition to its unparalleled accuracy and ease of use, the FA1816 also boasts significantly improved operability, making it the perfect choice for any production environment. If you’re looking for a reliable, efficient, and accurate flying probe tester, look no further than the HIOKI FA1816.

Number of arms 2 (top surface × 2)
Compatible probes 1172 series, CP1072 series
Number of test steps 999,999 steps
Test parameters and measurement ranges Resistance measurement : 40.00 μΩ to 40.00 MΩ
Insulation measurement : 1.000 kΩ to 500.0 MΩ
Capacitance measurement : 100.0 fF to 10.00 μF
Leakage current measurement : 1.000 μA to 10.00 mA
High-voltage resistance measurement : 1.000 kΩ to 500.0 MΩ
Capacitor insulation measurement : 1.000 kΩ to 10.00 MΩ
Open measurement : 4.000 Ω to 4.000 MΩ
Short measurement : 400.0 mΩ to 40.00 kΩ
Judgment range -99.9% to +999.9% or absolute value
Minimum pad pitch 40 μm (with CP1075-09)
Minimum pad size 10 μm (with CP1075-09)
Measurement speed Max. 100 points/sec. (0.1 mm movements, 2-arm simultaneous probing, capacitance measurement)
Testable boards 50 mm (1.97 in) W × 50 mm (1.97 in) D to 610 mm (24.02 in) W × 510 mm (20.08 in) D, Thickness 0.1 mm (0.004 in) to 3.2 mm (0.13 in)
Maximum testable area 610 mm (24.02 in) W × 510 mm (20.08 in) D
Power supply 200 V, 220 V, 230 V, 240 V AC single phase (specify at time of order),
50 Hz/ 60 Hz, Maximum power consumption: 3 kVA
Dimensions and mass 1303 mm (51.30 in) W × 1194 mm (47.01 in) H × 1167 mm (45.94 in) D (excluding protruding parts), 900 kg (31746 oz)

Key Features

  • Functionality has been consolidated in a single, desktop tower that can be easily embedded in existing equipment
  • Extensive function testing
  • Electrolytic capacitor and IC reverse insertion detection
  • Macro-testing function to increase test efficiency
  • Four-terminal low-resistance measurement for stable measurement of low resistance

Application Notes

Manufacturer

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