MX300D Series IGBT Dynamic Test System

MX300D Series IGBT Dynamic Test System

IGBT Dynamic Test System is composed of high precision programmable DC power supply, fixture unit, sampling & control unit, drive unit, protection unit, and supporting measuring instruments. With software independently developed by Kewell, the system provides a stable and precise platform to test the dynamic characteristics of IGBT.

  • Turn-on test (Pon, Eon)
  • Turn-off test (Poff, Eoff)
  • Reverse recovery characteristics of diode

Category:

Key Features

  • Turn-on test (Pon, Eon)
  • Turn-off test (Poff, Eoff)
  • Reverse recovery properties of diode
  • Short-circuit characteristics
  • Gate-charge QG test

Product Advantages

  • Versatile test functions: single pulse test, double pulse test, and short-circuit test.
  • Process capability of low stray inductance.
  • Overcurrent protection and quick current-off capability.
  • High measurement accuracy.
  • Wide voltage output and multi-grade inductive load. Satisfy the diverse requirements of dynamic testing.
  • Real-time monitoring function, and data logging & analysis functions.
  • Test work-step and protection variables can be adjust online.

Application Notes

Manufacturer

Downloads

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