NFP H-Field Probe Kit

Live tracking: A Rapid Handheld Probe Scanning Solution

NFP Kit designed by Y.I.C. Technologies is designed for measuring near field emissions for EMC/EMI Troubleshooting and Pre-Compliance testing.

These probes is used to locate, identify, measure, and characterize potential sources of electromagnetic radiation. Interference radiated from traces or components of electronic PCBs, assemblies, cables, enclosures, or products can also be located. The probe output is proportional to the magnetic field (H) strength present at the probe location.