Hioki IM7581 Impedance Analyser

Hioki IM7581 Impedance Analyser

Hioki LCR Meters and Impedance Analyzers range from 1mHz to 3GHz devices to suit a wide range of applications in the testing of electronic components.

The Hioki IM7581 offers a top measurement time of 0.5ms over a 100kHz to 300MHz frequency range, making it ideal for high volume production of ferrite chip beads and chip inductors.

Hioki IM9202 test fixture video.

 

 

Basic specifications (Accuracy guaranteed for 1 year, Post-adjustment accuracy guaranteed for 1 year)

Measurement modes LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode
Measurement parameters Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q
Measurable range 100 mΩ to 5 kΩ
Display range Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ)
Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99)
θ: ± (0.000° to 180.000°), Cs, Cp: ± (0.00000 p to 9.99999 GF)
D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS)
G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %)
Basic accuracy Z: ±0.72 % rdg. θ: ±0.41°
Measurement frequency 100.00 kHz to 300.00 MHz (5 digits resolution)
Measurement signal level Power: -40.0 dBm to +7.0 dBm
Voltage: 4 mV to 1001 mVrms
Current: 0.09 mA to 20.02 mArms
User-configured power, voltage, and current
Output impedance 50 Ω
Display 8.4-inch color TFT with touch screen
Measurement speeds *1 FAST: 0.5 ms / MED: 0.9 ms / SLOW: 2.1 ms / SLOW2: 3.7 ms
*1 Analog measurement time
Functions Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation
Interfaces Handler, USB, LAN, GP-IB (optional), RS-232C (optional)
Power supply 100 to 240 V AC, 50/60 Hz, 70 VA max.
Dimensions and mass Main unit: 215 mm (8.46 in) W × 200 mm (7.87 in) H × 268 mm (10.55 in) D, 6.5 kg (229.3 oz)
Test head: 61 mm (2.40 in) W × 55 mm (2.17 in) H × 24 mm (0.94 in) D, 175 g (6.2 oz)
Accessories Test head ×1, Connection cable ×1, Power cord ×1, Instruction manual ×1, LCR application disc (Communications user manual) ×1

Category:

Key Features

  • 100 kHz to 300 MHz testing source frequency
  • Fastest test speed of 0.5 msec (Analog measurement time)
  • ±0.72% rdg. basic accuracy
  • Half-rack size body and palm-sized test head
  • Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
  • Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode

Application Notes